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Support for Emperical Line Method (ELM) for Calibrate Reflectance
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Topic: Support for Emperical Line Method (ELM) for Calibrate Reflectance (Read 5288 times)
wizprod
Jr. Member
Posts: 85
Support for Emperical Line Method (ELM) for Calibrate Reflectance
«
on:
September 08, 2023, 11:14:54 AM »
Hi all,
I'd like to request that the Calibrate Reflectance feature in Metashape also support the Emperical Line method using 2 or more grey patches.
I'm using the Mapir T3-R50 (
https://www.mapir.camera/en-gb/products/diffuse-reflectance-standard-calibration-target-package-t3-r50
), which has 4 patches.
More info on ELM here:
https://www.mdpi.com/2072-4292/15/11/2909
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Support for Emperical Line Method (ELM) for Calibrate Reflectance
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